Effect of thermal annealing on dynamics of photoluminescence in a-GeSe2 films

We have investigated the effect of thermal annealing on dynamics of photolu minescence (PL) in vacuum-evaporated a-GeSe2 films with thickness of 15 mu m. The intensity of PL increases over 200 times after annealing at 250 degr ees C, which makes it possible to take a first investigation on both decay time and fatigue effect. The disordered amorphous structure of the a-GeSe2 film, containing wrong bonds, Ge-Ge and Se-Se, has been reconstructed to a stable structure by diminishing the number of the wrong bonds and the relat ed strain or internal pressure by thermal annealing. (C) 2000 Elsevier Scie nce B.V. All rights reserved.