N. Wyrsch et al., Hydrogenated microcrystalline silicon: how to correlate layer properties and solar cell performance, J NON-CRYST, 266, 2000, pp. 1099-1103
Undoped hydrogenated microcrystalline silicon (mu c-Si:H) layers and cells
have been deposited by plasma chemical vapour deposition at low temperature
at different powers and silane dilutions. Electronic transport properties
and defect density of the layers have been compared to the cell performance
s to identify the important material properties for solar cell applications
. A correlation is found between the defect density, mu(0)tau(0) quality pa
rameter, and cell efficiency. Anisotropy of the transport properties in som
e mu c-Si:H is also demonstrated. (C) 2000 Elsevier Science B.V. All rights
reserved.