Hydrogenated microcrystalline silicon: how to correlate layer properties and solar cell performance

Citation
N. Wyrsch et al., Hydrogenated microcrystalline silicon: how to correlate layer properties and solar cell performance, J NON-CRYST, 266, 2000, pp. 1099-1103
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF NON-CRYSTALLINE SOLIDS
ISSN journal
00223093 → ACNP
Volume
266
Year of publication
2000
Part
B
Pages
1099 - 1103
Database
ISI
SICI code
0022-3093(200005)266:<1099:HMSHTC>2.0.ZU;2-T
Abstract
Undoped hydrogenated microcrystalline silicon (mu c-Si:H) layers and cells have been deposited by plasma chemical vapour deposition at low temperature at different powers and silane dilutions. Electronic transport properties and defect density of the layers have been compared to the cell performance s to identify the important material properties for solar cell applications . A correlation is found between the defect density, mu(0)tau(0) quality pa rameter, and cell efficiency. Anisotropy of the transport properties in som e mu c-Si:H is also demonstrated. (C) 2000 Elsevier Science B.V. All rights reserved.