The photocurrent delivered by entirely microcrystalline p-i-n-Si:H detector
is analyzed under different applied bias and light illumination conditions
. The internal collection depends not only on the energy range but also on
the illumination side. Under [p] and [n] side irradiation the internal coll
ection properties have an atypical shape. It is larger for an applied bias
less than the open circuit voltage, has a decrease near the open circuit vo
ltage (higher under [n] side illumination) and becomes almost invariant for
larger voltages. Additionally, numerical modeling of the visible/near infr
ared detector including the grain boundaries and the interfaces complements
the study and provides a knowledge into the internal physical process. (C)
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