Transport mechanism of deposition precursors in catalytic chemical vapor deposition studied using a reactor tube

Citation
N. Honda et al., Transport mechanism of deposition precursors in catalytic chemical vapor deposition studied using a reactor tube, J NON-CRYST, 266, 2000, pp. 100-104
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF NON-CRYSTALLINE SOLIDS
ISSN journal
00223093 → ACNP
Volume
266
Year of publication
2000
Part
A
Pages
100 - 104
Database
ISI
SICI code
0022-3093(200005)266:<100:TMODPI>2.0.ZU;2-R
Abstract
Transport mechanism of deposition precursors in catalytic chemical vapor de position (CVD) often called hot-wire CVD, was investigated to identify the precursor species and make the conditions for uniform-film preparation know n. Precursor-transport mechanism was analysed from the film-thickness profi les of amorphous silicon in the reactor tube as a function of the distance from the catalyzer. It was found that precursors are mainly transported by thermal diffusion. However, the affect of the gas flow on precursor transpo rt was effective at a pressure of a few tens Pa and gas-flow velocity faste r than several m/s. Decomposition probability of one SiH4 molecule by one c ollision with the catalyzer is estimated to be about 40%. Efficiency of gas use for SiH4 was several tens % because of high decomposition probability of SiH4. (C) 2000 Elsevier Science B.V. All rights reserved.