Stability aspects of the Mo/Cu(In,Ga)Se-2/CdS/ZnO solar cell are reviewed a
nd assessed. These include (i) the chemical stability of the various interf
aces present in the device, (ii) the long-term behavior of metastable defec
ts found in the Cu(In,Ga)Se-2 (CIGS) compound, and (iii) the impact of Cu m
igration on device performance and lifetime. We find that (i) all interface
s within the structure are chemically stable, (ii) metastable defects have
a beneficial effect on performance, and (iii) Cu migration effects are reve
rsible and their possible detrimental effects are eclipsed by the beneficia
l effect of the metastable states. Moreover, Cu out-diffusion from the CIGS
layer is absent in photovoltaic-quality CIGS. Finally, we propose a model
that explains the exceptional radiation hardness and impurity tolerance of
CIGS-based devices, based on the synergetic effect of copper migration and
point defect reactions.