We calculate the effect of stray capacitance on the performance of the
electron pump for a simplified and experimentally appropriate circuit
model. We show that to first order the effect of the stray capacitanc
es can be accounted for by replacing the junction capacitance C with C
+ a C(stray), where a approximately 1 and C(stray) is the average tot
al stray capacitance of the metal islands between the junctions.