Solid-state NMR and ellipsometric investigations of C-30 chains bonded to SiO2 surfaces

The morphology of C-30 alkyl chains bonded to different inorganic substrate s such as fine ground glass particles, silica gel as well as silica wafers has been investigated by the combined use of solid-state NMR spectroscopy a nd ellipsometry. It could be shown that the average phase thickness of the bonded C-30 layer of 29 Angstrom is primarily dependent upon the employed p olymeric surface reaction procedure and does not reflect the type of the em ployed inorganic substrate. A refined model of the C-30 alkyl chain organiz ation for solution polymerization on silica surfaces could be developed.