FIM and 3D atom probe analysis of Cu/Nb nanocomposite wires

Two kinds of Cu/Nb nanocomposite wires were investigated using field ion mi croscopy (FIM) and 3D atom probe. These two techniques revealed for the fir st time the nanoscale microstructure of nanocomposite wire cross sections. FIM investigations confirmed the Cu and Nb texture and the disorientation b etween (111) Cu and (110) Nb planes. Low angle Nb/Nb grain boudaries were a lso observed. Thanks to 3D atom probe, parts of niobium fibres and copper c hannels a few nanometer width were mapped out in 3D. Smooth Cu/Nb interface s were attributed to stress-induced diffusion. Shear bands, observed perpen dicular to the wire axis, were attributed to tracks of moving dislocations in a copper channel. (C) 2000 Acta Metallurgica Inc.