Rn. Bhattacharya et al., Improved electrodeposition process for the preparation of superconducting thallium oxide films, PHYSICA C, 333(1-2), 2000, pp. 59-64
We report on developing a two-layer process to deposit biaxially textured T
l-oxide films by electrodeposition (ED) on Ag-coated, single-crystal substr
ates. Pole-figure measurements of two-layer, electrodeposited (Tl,Bi)-(Sr,B
a)-Ca-Cu-O (TBSBCCO) films on 300 Angstrom Ag/LaAlO3 (LAO), with thickness
between 1 and 5 mu m, clearly show strong biaxial texturing. The omega scan
and phi scan of 1.6 mu m (TlBi)(0.9)Sr1.6Ba0.4Ca2Cu3Ag0.2Ox films indicate
the full width at half maximum (FWHM) of only 0.92 degrees and 0.6 degrees
, respectively, indicating a very high-quality film prepared by the ED proc
ess. Transport measurements for the electrodeposited, thallium-oxide-based
superconductor films show values above 10(6) A/cm(2) at 77 K in zero field.
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