D. Koelle et al., Vortex imaging by low-temperature scanning electron microscopy and correlation with low-frequency noise in YBCO DC SQUIDs, PHYSICA C, 332(1-4), 2000, pp. 148-155
We present a technique for direct imaging of magnetic flux quanta trapped i
n direct current (DC) superconducting quantum interference devices (SQUIDs)
which consist either of washers patterned in single YBa2Cu3O7-delta (YBCO)
films or which are patterned in multilayer structures from YBCO/SrTiO3/YBC
O thin films. Simultaneously, we are able to measure the low-frequency nois
e of our devices under test, which allows correlation of the local distribu
tion of vortices with low-frequency noise in the SQUIDs. The vortex imaging
and noise measurements are performed with the SQUIDs mounted on a liquid n
itrogen cooled cryostage of a scanning electron microscope (SEM) for invest
igation at variable temperature (77 K < T< T-c) and in controllable magneti
c fields up to several hundred mu T Our imagine technique, which yields a s
patial resolution of about 1 mu m, is based on the electron-beam-induce loc
al displacement Delta r of vortices, which is detected as a flux change Del
ta Phi = Delta r(partial derivative Phi/partial derivative r) in the SQUID
loop. Hence, the signal amplitude provides direct information on the coupli
ng strength partial derivative Phi/partial derivative r. since partial deri
vative Phi/partial derivative r determines the amount of flux noise which a
fluctuating vortex induces in the SQUID, we obtain valuable information on
possible low-frequency noise sources in the SQUIDs, We investigated washer
SQUIDs with regular arrays of micron-sized holes (antidots) to image the c
ompering formation of multiquanta trapped in antidots vs. the formation of
interstitial vortices. In most cases, the interstitial vortices are pinned
reproducibly at the same locations. These pinning sites do not correlate wi
th the surface morphology of the films. (C) 2000 Elsevier Science B.V. All
rights reserved.