Transport in quantum wells in the presence of interface roughness

Authors
Citation
Cy. Mou et Tm. Hong, Transport in quantum wells in the presence of interface roughness, PHYS REV B, 61(19), 2000, pp. 12612-12615
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
61
Issue
19
Year of publication
2000
Pages
12612 - 12615
Database
ISI
SICI code
0163-1829(20000515)61:19<12612:TIQWIT>2.0.ZU;2-S
Abstract
The effective Hamiltonian for two-dimensional quantum wells with rough inte rfaces is formally derived. Two terms are generated. The first term is iden tified with local energy-level fluctuations, and was introduced phenomenolo gically in the literature for interface roughness scattering, however, is n ow shown to be valid only for an infinite potential well or Hamiltonians wi th one single length scale. The other term is shown to modulate the wave fu nction and cause fluctuations in the charge density. This will further redu ce the electron mobility to a magnitude that is close to the experimental r esult.