Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2

Citation
Y. Harada et al., Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2, PHYS REV B, 61(19), 2000, pp. 12854-12859
Citations number
38
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
61
Issue
19
Year of publication
2000
Pages
12854 - 12859
Database
ISI
SICI code
0163-1829(20000515)61:19<12854:PDOSRS>2.0.ZU;2-2
Abstract
Polarization dependence of soft-x-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering feature appears about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibond ing state between 3d(1)L(-1) and 3d(0) states, because they are enhanced wh en the incident photon energies are tuned at satellite structures of Ti 2p absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They are assigned to be nonbonding type c harge transfer excitations or interband transition from O 2p valence to Ti 3d conduction bands, which includes the crystal field splitting in D-2h sym metry with two Ti-O bond lengths.