The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic composites

Citation
Km. Knowles et S. Turan, The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic composites, ULTRAMICROS, 83(3-4), 2000, pp. 245-259
Citations number
26
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ULTRAMICROSCOPY
ISSN journal
03043991 → ACNP
Volume
83
Issue
3-4
Year of publication
2000
Pages
245 - 259
Database
ISI
SICI code
0304-3991(200006)83:3-4<245:TDOEFT>2.0.ZU;2-P
Abstract
High-resolution transmission electron microscope observations of hexagonal boron nitride - 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equ ilibrium film thickness can arise. Theoretical considerations of this pheno menon in terms of the equilibrium thickness of an amorphous film between tw o crystalline media are consistent with the trend seen experimentally. (C) 2000 Elsevier Science B.V. All rights reserved.