Km. Knowles et S. Turan, The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic composites, ULTRAMICROS, 83(3-4), 2000, pp. 245-259
High-resolution transmission electron microscope observations of hexagonal
boron nitride - 3C silicon carbide interphase boundaries suggest that where
one or more phases is highly anisotropic, an orientation dependence on equ
ilibrium film thickness can arise. Theoretical considerations of this pheno
menon in terms of the equilibrium thickness of an amorphous film between tw
o crystalline media are consistent with the trend seen experimentally. (C)
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