Ultra-high resolution electron microscopy investigation of growth defects in CVD diamond films: twin interactions and fivefold twin centres

Citation
S. Delclos et al., Ultra-high resolution electron microscopy investigation of growth defects in CVD diamond films: twin interactions and fivefold twin centres, DIAM RELAT, 9(3-6), 2000, pp. 346-350
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
9
Issue
3-6
Year of publication
2000
Pages
346 - 350
Database
ISI
SICI code
0925-9635(200004/05)9:3-6<346:UREMIO>2.0.ZU;2-B
Abstract
An elucidation of the core structure of fivefold twin centres arising from the interaction between less than five first-order twin boundaries in plasm a-assisted chemical vapour deposition (CVD) of diamond films is reported. T hese particular twinning centres have been identified by ultra-high resolut ion electron microscopy at 0.12 nm resolution, with the help of image calcu lations. Plausible three-dimensional atomic-scale models are proposed for t wo specific structural variants, which have been found closely connected to high-order twin boundaries via original heptagonal or octagonal structural units. To our knowledge, this is the first time that such types of fivefol d twin centres and associated structural units, which are quite representat ive of the growth defects observed in CVD diamond, have been reported. (C) 2000 Elsevier Science S.A. All rights reserved.