Chemical stability of nano-diamond films deposited by the dc-glow discharge process

Citation
I. Gouzman et A. Hoffman, Chemical stability of nano-diamond films deposited by the dc-glow discharge process, DIAM RELAT, 9(3-6), 2000, pp. 378-383
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
9
Issue
3-6
Year of publication
2000
Pages
378 - 383
Database
ISI
SICI code
0925-9635(200004/05)9:3-6<378:CSONFD>2.0.ZU;2-1
Abstract
The precursor for chemically vapor deposited diamond may be formed using a de-glow discharge process for in situ surface pretreatment. The promotion o f diamond deposition by this method is primarily due to the formation of na no-sized diamond particles. In the present work, we used hydrogen plasma ex posure as a chemical probe to study the nature and chemical stability of th e carbon precursor for diamond deposition formed by the dc-glow discharge p retreatment. This method is based on the difference in the etching rates of various carbon phases in hydrogen plasma. Graphitic and amorphous, sp(2)- as well as sp(3)-bonded, carbon structures undergo a very rapid etching pro cess. whereas the etching rate of diamond is negligible. The characterization of the deposited films was carried out using high-reso lution scanning electron microscopy (HR SEM) and near-edge X-ray absorption fine structure (NEXAFS). Based on the NEXAFS measurements, it is shown tha t the hydrogen plasma etching results in a relative decrease in sp(2)-bonde d carbon and a corresponding increase of the sp(3)-fraction in the nearsurf ace layer. The etching rate of nearly continuous nano-diamond films was fou nd to be ca 0.5 mu m/h. HR SEM observations show inhomogeneous character of the etching process. (C) 2000 Elsevier Science S.A. All rights reserved.