Modeling of gas phase nucleation during silicon carbide chemical vapor deposition

Citation
An. Vorob'Ev et al., Modeling of gas phase nucleation during silicon carbide chemical vapor deposition, DIAM RELAT, 9(3-6), 2000, pp. 472-475
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
9
Issue
3-6
Year of publication
2000
Pages
472 - 475
Database
ISI
SICI code
0925-9635(200004/05)9:3-6<472:MOGPND>2.0.ZU;2-2
Abstract
An advanced model taking into account silicon cluster formation in the gas phase is suggested. 2D simulation is carried out at the growth parameters t ypical for chemical vapor deposition (CVD) of SiC in a vertical reactor. It is found that two main parameters have a significant effect on the nucleat ion and transport of the clusters in the gas phase: the input flow rate of silane and the thermophoretic force. Using a special criterion, the growth conditions favorable for parasitic graphite and silicon phases formation ar e determined. The obtained results are in good agreement with experimental data. (C) 2000 Elsevier Science S.A. All rights reserved.