Growth and high temperature performance of semi-insulating silicon carbide

Authors
Citation
Sa. Reshanov, Growth and high temperature performance of semi-insulating silicon carbide, DIAM RELAT, 9(3-6), 2000, pp. 480-482
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
9
Issue
3-6
Year of publication
2000
Pages
480 - 482
Database
ISI
SICI code
0925-9635(200004/05)9:3-6<480:GAHTPO>2.0.ZU;2-1
Abstract
The problems of obtaining insulating properties in bulk single-crystal sili con carbide by vanadium doping under the LETI method growth process are con sidered. The prime novelty of this work is the growth of a semi-insulating bulk single-crystal n-4H-SiC:V by the LETI method in vacuum from a vanadium and aluminium-containing source. The obtained 4H-SiC:V material possesses resistivity > 10(7) Omega cm at 20 degrees C and activation energy similar to 1.6 eV at 20-800 degrees C and can be applied as a semi-insulating subst rate material for extreme electronics based on silicon carbide or nitrides. (C) 2000 Elsevier Science S.A. All rights reserved.