Growth, characterization, optical and X-ray absorption studies of nano-crystalline diamond films

Citation
Lc. Chen et al., Growth, characterization, optical and X-ray absorption studies of nano-crystalline diamond films, DIAM RELAT, 9(3-6), 2000, pp. 877-882
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
9
Issue
3-6
Year of publication
2000
Pages
877 - 882
Database
ISI
SICI code
0925-9635(200004/05)9:3-6<877:GCOAXA>2.0.ZU;2-Y
Abstract
We report here the growth of thin diamond films, with an average grain size ranged from 3.6 nm to 5 mu m, by microwave plasma enhanced chemical vapor deposition via different substrate pretreatment and varying methane fractio n in the source gas. Specifically? the substrate pretreatment involved usin g two different grain sizes, 4 mm and 0.1 mu m, of the diamond powder for u ltrasonic agitation. Transmission electron microscopy, optical transmission spectra, and X-ray absorption spectra have been employed to characterize t he resultant films. For each him, the grain size distribution was obtained by directly analyzing the dark-field images of the film. For films deposite d with 0.1 mu m diamond powder pretreatment, the grain size of the film dec reased as the methane fraction increased. The opposite trend was observed f or 4 nm diamond powder pretreated films. X-ray absorption spectra at the C K-edge showed clear bulk diamond excitonic and sp(3) features with little e vidence of sp(2) bonding even for films with an average grain size as low a s 3.6 nm. Furthermore, a blue shift of the exciton state and conduction ban d edge was observed with the decrease of the grain size of the film, indica ting a quantum confinement effect. On the other hand, no direct relationshi p between the grain size of the film and the optical transmission was obser ved. The key parameter that dictated the optical transparency of the film w as the surface roughness provided that the film maintained high sp(3) conte nt. (C) 2000 Elsevier Science S.A. All rights reserved.