Aggregation of small Csl clusters inside Ar clusters: ionization and fragmentation under soft X-ray excitation

Citation
A. Kolmakov et al., Aggregation of small Csl clusters inside Ar clusters: ionization and fragmentation under soft X-ray excitation, EUR PHY J D, 9(1-4), 1999, pp. 277-281
Citations number
20
Categorie Soggetti
Physics
Journal title
EUROPEAN PHYSICAL JOURNAL D
ISSN journal
14346060 → ACNP
Volume
9
Issue
1-4
Year of publication
1999
Pages
277 - 281
Database
ISI
SICI code
1434-6060(199912)9:1-4<277:AOSCCI>2.0.ZU;2-P
Abstract
Medium size Ar clusters < N > similar to 500 were used to pick-up and aggre gate CsI molecules. The primary Ar cluster beam can be converted into a bea m of bare or Ar-covered alkali halide clusters by varying the number of pic k-up events. Soft X-ray photoionisation was used to monitor the depletion o f the Ar shell around the guest cluster. It was found that the Ar coverage controls the mechanism and degree of guest cluster ionization. For embedded CsI clusters charge transfer from the Ar shell is the dominant soft X-ray ionization process. Small alkali halide cluster fragments are ejected from the Ar host cluster. The detection of weakly bound stoichiometric (CsI)(n)( +) clusters indicates that the Ar-shell prevents the desorption of neutral halogen atoms.