RMS slope of exponentially correlated surface roughness for radar applications

Authors
Dierking, W
Citation
W. Dierking, RMS slope of exponentially correlated surface roughness for radar applications, IEEE GEOSCI, 38(3), 2000, pp. 1451-1454
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
ISSN journal
01962892 → ACNP
Volume
38
Issue
3
Year of publication
2000
Pages
1451 - 1454
Database
ISI
SICI code
0196-2892(200005)38:3<1451:RSOECS>2.0.ZU;2-F
Abstract
In radar signature analysis, the root mean square (RMS) surface slope is ut ilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be dete rmined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simula tions are discussed.