Testing microwave devices under different source impedance values - A novel technique for on-line measurement of source and device reflection coefficients
G. Madonna et al., Testing microwave devices under different source impedance values - A novel technique for on-line measurement of source and device reflection coefficients, IEEE INSTR, 49(2), 2000, pp. 285-289
Citations number
13
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
This paper describes a new approach for fast and accurate determination of
the source reflection coefficient in microwave source-pup measurements, To
the authors' knowledge, this is the only technique that allows the simultan
eous measurement of the source and the device-under-test input reflection c
oefficients, A traditional vector network analyzer is used as a four-channe
l receiver, The calibration procedure is based on a new reflectometer model
that extends the traditional error box concept. Experimental results are p
resented and compared to data obtained with traditional techniques.