HIGH-TEMPERATURE ELECTRONICS USING SIC - ACTUAL SITUATION AND UNSOLVED PROBLEMS

Citation
Ve. Chelnokov et Al. Syrkin, HIGH-TEMPERATURE ELECTRONICS USING SIC - ACTUAL SITUATION AND UNSOLVED PROBLEMS, Materials science & engineering. B, Solid-state materials for advanced technology, 46(1-3), 1997, pp. 248-253
Citations number
29
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
09215107
Volume
46
Issue
1-3
Year of publication
1997
Pages
248 - 253
Database
ISI
SICI code
0921-5107(1997)46:1-3<248:HEUS-A>2.0.ZU;2-5
Abstract
The high temperature applications of SiC based devices have been consi dered for a long time. On the other hand, the recent progress in the e pitaxial and bulk growth of silicon carbide have made possible the rea lization of a large variety of devices intended for specific applicati ons. However, the full achievement of high temperature capabilities of SiC will not be only determined by the development of the material it self (purification, structural perfectness etc.) but also by the devel opment of related device elements such as ohmic contacts, insulating l ayers, interconnections, encapsulation techniques, etc. This paper rev iews two groups of problems which play a key role in the development o f a SiC based high temperature electronics: (1) physical problems of t he real high temperature properties of SiC. (2) physical and technical problems of the high temperature related electrical parts. (C) 1997 E lsevier Science S.A.