Ve. Chelnokov et Al. Syrkin, HIGH-TEMPERATURE ELECTRONICS USING SIC - ACTUAL SITUATION AND UNSOLVED PROBLEMS, Materials science & engineering. B, Solid-state materials for advanced technology, 46(1-3), 1997, pp. 248-253
The high temperature applications of SiC based devices have been consi
dered for a long time. On the other hand, the recent progress in the e
pitaxial and bulk growth of silicon carbide have made possible the rea
lization of a large variety of devices intended for specific applicati
ons. However, the full achievement of high temperature capabilities of
SiC will not be only determined by the development of the material it
self (purification, structural perfectness etc.) but also by the devel
opment of related device elements such as ohmic contacts, insulating l
ayers, interconnections, encapsulation techniques, etc. This paper rev
iews two groups of problems which play a key role in the development o
f a SiC based high temperature electronics: (1) physical problems of t
he real high temperature properties of SiC. (2) physical and technical
problems of the high temperature related electrical parts. (C) 1997 E
lsevier Science S.A.