T. Veres et al., Ion-beam modification of Co/Ag multilayers II: Variation of structural andmagnetic properties with Co layer thickness, J APPL PHYS, 87(12), 2000, pp. 8513-8521
The structural, magnetic and transport properties of rf sputtered Co/Ag mul
tilayers with Co-layer thicknesses ranging from 1 to 14 Angstrom have been
studied by a combination of x-ray diffraction, magnetic and transport measu
rements. The magnetoresistance at room temperature has a maximum value of m
ore than 12% for a Co-layer thickness around 5 Angstrom. Magnetic measureme
nts demonstrate that samples near this Co-layer thickness are in the transi
tion region from superparamagnetic to ferromagnetic behavior. X-ray analysi
s indicates that, during deposition, a significant quantity of Co is disper
sed throughout a highly textured Ag matrix. Upon irradiation with 1 MeV Si ions up to a dose of 5x10(16) Si+/cm(2), an initial demixing of the Co is
followed by segregation into grains with the same texture as the Ag. The re
sulting changes in the magnetization and magnetoresistance are characterize
d on the basis of a log-normal distribution of the volume of the magnetic p
articles. As the particle sizes increase, a systematic evolution towards fe
rromagnetic behavior for films initially in the superparamagnetic and trans
ition regions results. (C) 2000 American Institute of Physics. [S0021-8979(
00)08912-X].