Localized electronic states related to O-2 intercalation and photoirradiation on C-60 films and C-70 films

Citation
H. Habuchi et al., Localized electronic states related to O-2 intercalation and photoirradiation on C-60 films and C-70 films, J APPL PHYS, 87(12), 2000, pp. 8580-8588
Citations number
38
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
12
Year of publication
2000
Pages
8580 - 8588
Database
ISI
SICI code
0021-8979(20000615)87:12<8580:LESRTO>2.0.ZU;2-2
Abstract
Deep localized electronic states are created by O-2 intercalation into C-60 films and C-70 films, which causes the Fermi level to shift down to the mi ddle of gap. The states act as a trap level for charge carriers and as nonr adiative recombination centers. It seems that prepared C-60 films and C-70 films have a shallow localized state. The shallow state is located at simil ar to 0.2 eV under the conduction band and affects the electrical and optic al properties. Furthermore, the photoirradiation of C-60 films and C-70 fil ms causes polymerization of the O-2-free sample and oxidization of the O-2- intercalated sample. The quasistable electronic states at room temperature are created as a result of photo-oxidization of C-60 films. C-60 oxides cre ate deep localized electronic states which cannot disappear under thermal a nnealing. The photoluminescence intensity of O-2-free samples increases wit h photoirradiation for 1 h. It is found for the first time that this increa se occurs along with a decrease of localized state density. (C) 2000 Americ an Institute of Physics. [S0021-8979(00)02712-2].