Fluorescence technique to study thickness effect on dissolution of latex films

Authors
Citation
S. Ugur et O. Pekcan, Fluorescence technique to study thickness effect on dissolution of latex films, J APPL POLY, 77(5), 2000, pp. 1087-1095
Citations number
31
Categorie Soggetti
Organic Chemistry/Polymer Science","Material Science & Engineering
Journal title
JOURNAL OF APPLIED POLYMER SCIENCE
ISSN journal
00218995 → ACNP
Volume
77
Issue
5
Year of publication
2000
Pages
1087 - 1095
Database
ISI
SICI code
0021-8995(20000801)77:5<1087:FTTSTE>2.0.ZU;2-Q
Abstract
In situ steady-state fluorescence (SSF) measurements were used for studying dissolution of Latex films in real time. Latex films with various thicknes ses are formed from pyrene (P) labeled poly(methyl methacrylate) (PMMA) lat ex particles, sterically stabilized by polyisobutylene (PIB). Annealing of latex films were performed above T-g at 220 degrees C temperature for 60 mi n. UV-Visible (UVV) spectrometer was used to measure the transparency of la tex films. It was observed that thicker films formed more opaque films than thinner films. Heptane (20%), chloroform (80%) mixture was used as a disso lution agent. Diffusion of pyrene labeled PMMA chains was monitored in real time by the change of pyrene fluorescence intensity, I-P in the polymer-so lvent mixture. Diffusion coefficients, D, and relaxation constants, k(0), o f PMMA chains were measured and found to be strongly dependent on the latex films thicknesses. It is observed that thicker and opaque films dissolved much faster than the thinner and transparent films. (C) 2000 John Wiley & S ons, Inc.