The influence of preparation conditions on the electrical and optical properties of oxidized indium thin films

Citation
M. Girtan et al., The influence of preparation conditions on the electrical and optical properties of oxidized indium thin films, MAT SCI E B, 76(2), 2000, pp. 156-160
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
76
Issue
2
Year of publication
2000
Pages
156 - 160
Database
ISI
SICI code
0921-5107(20000703)76:2<156:TIOPCO>2.0.ZU;2-V
Abstract
Highly conductive indium oxide thin films (rho = 5 x 10(-3) Omega cm) have been prepared by thermal oxidation in an open atmosphere of indium films de posited in vacuum by evaporation. The rate of indium film deposition was hi gh (5 Angstrom, s(-1)), and the oxidation has been carried out by exposing the samples to the atmosphere directly at high temperature (500 degrees C) for different times. Structural, optical and electrical properties of these samples were investigated. Films exhibit a (111) preferred orientation, Th e value of the transmittance coefficient in the visible region of the spect rum was low (50%) but, concerning the electrical properties, an interesting behaviour was observed: at temperatures above room temperature the electri cal resistance depends on the sense of the electrical current flow. (C) 200 0 Elsevier Science S.A. All rights reserved.