Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films

Based upon the superposition principle of the interference of light, the re lationship between Kerr rotation angle theta(k) and reflectivity R and opti cal constant and the thickness of transparent dielectric layers for double- layered films has been deduced theoretically. A simple and practical analyz ed method for determining the off-diagonal and diagonal elements of the die lectric tensor of magneto-optical films has been developed using the relati onship express of double-layered films and the measured results of Kerr rot ation angle theta(k) and reflectivity R. Results show that this method can solve the problem simply. The validity of the method has been verified thro ugh determination of the elements of the dielectric tensor of TbFeCo perpen dicular magnetic films in double-layered films of AlN/TbFeCo/glass. (C) 200 0 Elsevier Science S.A. All rights reserved.