Optical and recording properties of short wavelength optical storage materials

Citation
Fx. Gan et al., Optical and recording properties of short wavelength optical storage materials, MAT SCI E B, 76(1), 2000, pp. 63-68
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
76
Issue
1
Year of publication
2000
Pages
63 - 68
Database
ISI
SICI code
0921-5107(20000615)76:1<63:OARPOS>2.0.ZU;2-I
Abstract
Research interests in short wavelength optical storage have been growing co nsiderably in recent years. In this paper, we first present a brief introdu ction to the materials requirements for short wavelength optical storage an d basic considerations on the relation between reflectivity and optical con stants of the materials, and then report our experimental results on the op tical and short wavelength recording properties of the azo dye and the phas e change compounds, Ge2Sb2Te5 and Ag8In14Sb55Te23, The reflectivity contras t due to optical recording at 514.5 nm in the dye-polymer film is as high a s 25%. The change in n and k of the phase change materials due to heat trea tment can cause reasonably high reflectivity change at 500 nm, writing and erasing at 514.5 nm result in moderate reflectivity contrast. These suggest that the materials can be used for short wavelength optical storage. (C) 2 000 Elsevier Science S.A. All rights reserved.