Increasing reliability in gamma and X-ray spectral data analysis: least moduli approach

Authors
Kondrashov, VS Rothenberg, SJ Sajo-Bohus, L Greaves, ED Liendo, JA
Citation
Vs. Kondrashov et al., Increasing reliability in gamma and X-ray spectral data analysis: least moduli approach, NUCL INST A, 446(3), 2000, pp. 560-568
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
446
Issue
3
Year of publication
2000
Pages
560 - 568
Database
ISI
SICI code
0168-9002(20000521)446:3<560:IRIGAX>2.0.ZU;2-I
Abstract
A method for increasing reliability of parameter estimations for X- and gam ma-ray spectral data acquired by semiconductor detectors and multichannel a nalyzers has been developed. We describe the advantages of using the method of least moduli over the method of least squares when analyzing peaks with high peak/background ratios. The influence of different distortion factors was explored along with the limitations on applying the new method. (C) 20 00 Elsevier Science B.V. All rights reserved.