Sub-picosecond bunch length measurement at the TESLA test facility

Authors
Geitz, M Schmidt, G Schmuser, P Von Walter, G
Citation
M. Geitz et al., Sub-picosecond bunch length measurement at the TESLA test facility, NUCL INST A, 445(1-3), 2000, pp. 343-347
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
445
Issue
1-3
Year of publication
2000
Pages
343 - 347
Database
ISI
SICI code
0168-9002(20000501)445:1-3<343:SBLMAT>2.0.ZU;2-O
Abstract
Sub-picosecond electron bunches are required for the operation of future VU V and X-ray Free Electron Lasers. A streak camera, a Martin-Puplett interfe rometer and a longitudinal phase space rotation method have been applied at the TESLA Test Facility linac to measure electron bunch lengths. (C) 2000 Published by Elsevier Science B.V. All rights reserved.