As a step towards developing fast positrons as a probe to measure electron
density and spin magnetic density in crystals, an experiment has been perfo
rmed to measure the multiple scattering distribution of MeV positrons penet
rating through thin polycrystalline films in both random and channeling dir
ections. Image plate detectors were used to determine the angular distribut
ion of emergent positrons. Image plate sensitivity was measured for high-en
ergy positrons and for the background radiation encountered in our experime
nt. The image plates showed good sensitivity and good linearity for MeV pos
itrons. The multiple scattering results are compared with the theory for ra
ndom direction and show disagreement due to crystal effects and quantum mec
hanical considerations. (C) 2000 Elsevier Science B.V. All rights reserved.