To deduce the optical properties, the absorption coefficient mu(a) and redu
ced scattering coefficient mu(s)', of turbid medium, Lin et al. (Appl. Opt.
34 (1995) 2362) proposed an oblique incidence reflectometry in which the d
iffusion approximation was assumed. In this paper we propose an alternative
method which does not assume the diffusion approximation but uses a Monte
Carlo light propagation model. Two features are extracted from the diffuse
reflectance distribution detected on the medium surface, and optical proper
ties are then estimated by looking up the predetermined table generated by
Monte Carlo simulations. The validity of the proposed method has been confi
rmed by computer simulations.