The capacitance of grain boundaries in high-temperature superconductor thin films

Citation
Ej. Tarte et al., The capacitance of grain boundaries in high-temperature superconductor thin films, PHYSICA B, 284, 2000, pp. 628-629
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
284
Year of publication
2000
Part
1
Pages
628 - 629
Database
ISI
SICI code
0921-4526(200007)284:<628:TCOGBI>2.0.ZU;2-R
Abstract
We have studied the capacitance of grain boundary (GB) Josephson junctions in YBa2Cu3O7-delta thin films on 24 degrees SrTiO3 bicrystals. In order to reveal the contribution of the substrate to the capacitance of the junction s, we have varied the width of the junctions hence tuning the Fiske resonan t frequency. The results clearly indicate that the capacitance of the Josep hson junctions is dominated by the stray capacitance of the subtrate below a frequency of 130 GHz at 4.2 K. At this frequency a sharp change of the Sr TiO3 dielectric constant occurs which is associated with the paraelectric a nd the ferroelastic properties of this material. (C) 2000 Published by Else vier Science B.V. All rights reserved.