Observation of proximity effect in YBCO/Au bilayer films by microwave surface resistance measurements

Authors
Pan, VM Tarasov, VF Popov, AG Vysotskii, VV Lorenz, M Ivanyuta, AN Melkov, GA
Citation
Vm. Pan et al., Observation of proximity effect in YBCO/Au bilayer films by microwave surface resistance measurements, PHYSICA B, 284, 2000, pp. 915-916
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
284
Year of publication
2000
Part
1
Pages
915 - 916
Database
ISI
SICI code
0921-4526(200007)284:<915:OOPEIY>2.0.ZU;2-N
Abstract
Measurements of surface resistance R-s for YBCO films covered with thin Au layer of thickness d are carried out at 67 GHz in the temperature range 100 -60 K. Measured R-s(d) dependence exhibits a large maximum at small d appro ximate to 20 nm which cannot be explained by the simple model of normal met al-HTSC bilayer surface resistance. The difference is attributed to the pro ximity effects at the YBCO/Au interface. (C) 2000 Elsevier Science B.V. All rights reserved.