Semiconductor surface diffusion: Nonthermal effects of photon illumination

Citation
R. Ditchfield et al., Semiconductor surface diffusion: Nonthermal effects of photon illumination, PHYS REV B, 61(20), 2000, pp. 13710-13720
Citations number
61
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
61
Issue
20
Year of publication
2000
Pages
13710 - 13720
Database
ISI
SICI code
0163-1829(20000515)61:20<13710:SSDNEO>2.0.ZU;2-P
Abstract
Nonthermal influences of photon illumination on surface diffusion at high t emperatures have been measured experimentally. Activation energies and pre- exponential factors for diffusion of germanium, indium, and antimony on sil icon change by up to 0.3 eV and two orders of magnitude, respectively, in r esponse to illumination by photons having energies greater than the substra te band gap. The parameters decrease for n-type material and increase for p -type material. Aided by results from photoreflectance spectroscopy, we sug gest that motion of the surface quasi-Fermi-level for minority carriers acc ounts for much of the effect by changing the charge slates of surface vacan cies. An additional adatom-vacancy complexation mechanism appears to operat e on p-type substrates. The results have significant implications for aspec ts of microelectronics fabrication by rapid thermal processing that are gov erned by surface mobility.