Surface structures and thermal vibrations of Ni and Cu thin films studied by extended x-ray-absorption fine structure

Citation
M. Kiguchi et al., Surface structures and thermal vibrations of Ni and Cu thin films studied by extended x-ray-absorption fine structure, PHYS REV B, 61(20), 2000, pp. 14020-14027
Citations number
33
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
61
Issue
20
Year of publication
2000
Pages
14020 - 14027
Database
ISI
SICI code
0163-1829(20000515)61:20<14020:SSATVO>2.0.ZU;2-V
Abstract
Temperature- and angle-dependent extended x-ray-absorption fine-structure s pectra of Cu and Ni thin films grown epitaxially on highly oriented pyrolyt ic graphite were measured and analyzed in order to investigate the dynamica l properties of the surface metal-metal bonds. From the mean-square relativ e displacements of the metal-metal bonds, the effective Debye temperatures of the surface in-plane and out-of-plane bonds were determined. The surface bonds were found to be much softer and anharmonic, especially for the surf ace normal direction, than those of the corresponding bulk metals. We have also carried out classical Monte Carlo simulations for Cu films based on th e embedded-atom method. The experimental results were reproduced qualitativ ely well and it was clarified that the out-of-plane bonds between the first and the second layer are noticeably weaker than the other bonds such as th e in-plane bond in the first layer.