Tip-sample interaction in tapping-mode scanning force microscopy

Tip-sample interaction in intermittent contact scanning force microscopy, a lso called tapping mode, is experimentally studied to determine under which conditions tip-sample contact is established. Force vs distance curves are made while the cantilever is oscillating at its resonance frequency. Canti levers with different force constants driven at different oscillation ampli tudes have been used. In addition, samples with different hardness, such as silicon oxide, glass, and highly orientated pyrolytic graphite were taken as sample surface. From the analysis of the data we conclude that by choosi ng appropriate operating conditions, tip-sample contact can be avoided. Thi s operating regime is of general interest in scanning force microscopy, sin ce it allows imaging of even the softest samples.