We measure photon-assisted tunneling in 4- and 6-junction electron pumps at
photon frequencies up to 60 GHz. We determine the microwave voltage at the
pumps using noise thermometry. The standard theory of leakage in the elect
ron pump, modified to include photon-assisted tunneling, describes our expe
riments well. From this test of theory we argue that, in the absence of ext
ernal microwaves, photon-assisted tunneling driven by 1/f noise is an impor
tant error mechanism in electron pumps.