Calibration of a multiple microchannel plate detectors system by alpha-induced secondary electrons

Citation
J. Villette et al., Calibration of a multiple microchannel plate detectors system by alpha-induced secondary electrons, REV SCI INS, 71(6), 2000, pp. 2367-2370
Citations number
21
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
6
Year of publication
2000
Pages
2367 - 2370
Database
ISI
SICI code
0034-6748(200006)71:6<2367:COAMMP>2.0.ZU;2-Y
Abstract
alpha particles emitted from an Am-241 radioactive source at energies of 5. 4 MeV generate bursts of about ten electrons when passing through an alumin ized Mylar foil. Besides the typical surface barrier electrons, the energy spectra of the secondary electrons clearly reveal two additional peaks. One at 66 eV is ascribed to aluminum LVV Auger electrons and another at 10.5 e V is attributed to the decay of aluminum volume plasmons. The well-resolved angular and energy distributions of these secondary electrons are used to calibrate the relative detection efficiencies of a large set of individual detectors of a complex multicoincidence system. (C) 2000 American Institute of Physics. [S0034-6748(00)05206-0].