Characterization of a microfocused circularly polarized x-ray probe

Citation
J. Pollmann et al., Characterization of a microfocused circularly polarized x-ray probe, REV SCI INS, 71(6), 2000, pp. 2386-2390
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
6
Year of publication
2000
Pages
2386 - 2390
Database
ISI
SICI code
0034-6748(200006)71:6<2386:COAMCP>2.0.ZU;2-2
Abstract
We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bra gg-diffracting diamond phase retarder and subsequently focused down to a sp ot size of about 4 x 2 mu m(2) by a Fresnel zone plate. The properties of t he microprobe were characterized, and the technique was applied to the two- dimensional mapping of magnetic domains in HoFe2. (C) 2000 American Institu te of Physics. [S0034-6748(00)01206-5].