F. Duewer et al., Tip-sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging, REV SCI INS, 71(6), 2000, pp. 2414-2417
We implemented tip-sample distance control in a scanning evanescent microwa
ve probe for nonlinear dielectric microscopy. With the analytic expression
of the tip-sample capacitance as a function of tip-sample distance, we can
quantitatively regulate the tip-sample separation and independently measure
the dielectric nonlinearity by application of an ac bias voltage. Simultan
eous imaging of topography and ferroelectric domains has been demonstrated
on periodically poled LiNbO3 single crystals. (C) 2000 American Institute o
f Physics. [S0034-6748(00)05406-X].