Electronic structure of Mott insulators studied by inelastic X-ray scattering

Citation
Mz. Hasan et al., Electronic structure of Mott insulators studied by inelastic X-ray scattering, SCIENCE, 288(5472), 2000, pp. 1811-1814
Citations number
27
Categorie Soggetti
Multidisciplinary,Multidisciplinary,Multidisciplinary
Journal title
SCIENCE
ISSN journal
00368075 → ACNP
Volume
288
Issue
5472
Year of publication
2000
Pages
1811 - 1814
Database
ISI
SICI code
0036-8075(20000609)288:5472<1811:ESOMIS>2.0.ZU;2-0
Abstract
The electronic structure of Mott insulators continues to be a major unsolve d problem in physics despite more than 50 years of research. Well-developed momentum-resolved spectroscopies such as photoemission or neutron scatteri ng cannot probe the full Mott gap. High-resolution resonant inelastic x-ray scattering revealed dispersive charge excitations across the Mott gap in a high-critical temperature parent cuprate (Ca2CuO2Cl2), shedding Light on t he anisotropy of the Mott gap. These charge excitations across the Mott gap can be described within the framework of the Hubbard model.