III-N(110) surface relaxation and its dependence on the chemical bonding

Citation
R. Miotto et al., III-N(110) surface relaxation and its dependence on the chemical bonding, SOL ST COMM, 115(2), 2000, pp. 67-71
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE COMMUNICATIONS
ISSN journal
00381098 → ACNP
Volume
115
Issue
2
Year of publication
2000
Pages
67 - 71
Database
ISI
SICI code
0038-1098(2000)115:2<67:ISRAID>2.0.ZU;2-O
Abstract
Using existing and new results obtained from first-principles pseudopotenti al calculations, we have studied the atomic relaxation and its dependence o n the chemical bonding, on III-N(110) surfaces. It is found that the charac teristics of III-N(110) surfaces differ from other m-V(110) and II-VI(110) surfaces in two important aspects: a significantly reduced surface bond rot ation, and a much lower binding energy of the highest occupied surface stat e. Furthermore the results obtained for AlN and InN corroborate our previou sly proposed model of a linear relationship between the vertical buckling o f the top layer and the relaxed surface bond length not only for III-N, but also for III-V and II-VI semiconductors in general. (C) 2000 Elsevier Scie nce Ltd. All rights reserved.