Quasiresonant inelastic X-ray scattering: comparison of Compton and resonant terms

The contributions to inelastic X-ray scattering (IXS) spectra from the Comp ton scattering and X-ray resonant Raman scattering processes are theoretica lly compared. It is found that in the case of the atoms from Ni to Ge the m ain contribution to the IXS cross section originates from the process assoc iated with the formation of the intermediate virtual state (with 1s vacancy ) even when the incident photon energy is (several keV) less then the K abs orption edge. The double differential cross section is expressed in terms o f s, p and d partial local densities of electron states. (C) 2000 Elsevier Science Ltd. All rights reserved.