ELECTRICAL-PROPERTIES OF FERROELECTRIC BAMGF4 FILMS GROWN ON GAAS SUBSTRATES USING ALGAAS BUFFER LAYER

Citation
T. Hayashi et al., ELECTRICAL-PROPERTIES OF FERROELECTRIC BAMGF4 FILMS GROWN ON GAAS SUBSTRATES USING ALGAAS BUFFER LAYER, Applied surface science, 117, 1997, pp. 418-422
Citations number
11
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
117
Year of publication
1997
Pages
418 - 422
Database
ISI
SICI code
0169-4332(1997)117:<418:EOFBFG>2.0.ZU;2-2
Abstract
Ferroelectric BaMgF4 films have been grown on GaAs substrates with and without an AlGaAs buffer layer for metal-ferroelectric-semiconductor field effect transistor (MFSFET) applications. II is: shown that the t emperature range of 530-570 degrees C is suitable to grow the (140)-or iented BaMgF4 films on GaAs. Furthermore, it is demonstrated that the AlGaAs buffer layer is effective to reduce the leakage current. Capaci tance-voltage (C-V) characteristics of Al/BaMgF4/AlGaAs/n-GaAs/n(+)-Ga As(100) structures show a hysteresis loop with a counterclockwise trac e, demonstrating the ferroelectric nature of the BaMgF, film, On the o ther hand, the BaMgF4, film directly grown on GaAs substrates has Cloc kwise-hysteresis loops due to the charge injections. It is also shown that the remanent polarization estimated from the polarization-electri c field (P-E) characteristics is as large as 1.2 mu C/cm(2).