T. Hayashi et al., ELECTRICAL-PROPERTIES OF FERROELECTRIC BAMGF4 FILMS GROWN ON GAAS SUBSTRATES USING ALGAAS BUFFER LAYER, Applied surface science, 117, 1997, pp. 418-422
Citations number
11
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Ferroelectric BaMgF4 films have been grown on GaAs substrates with and
without an AlGaAs buffer layer for metal-ferroelectric-semiconductor
field effect transistor (MFSFET) applications. II is: shown that the t
emperature range of 530-570 degrees C is suitable to grow the (140)-or
iented BaMgF4 films on GaAs. Furthermore, it is demonstrated that the
AlGaAs buffer layer is effective to reduce the leakage current. Capaci
tance-voltage (C-V) characteristics of Al/BaMgF4/AlGaAs/n-GaAs/n(+)-Ga
As(100) structures show a hysteresis loop with a counterclockwise trac
e, demonstrating the ferroelectric nature of the BaMgF, film, On the o
ther hand, the BaMgF4, film directly grown on GaAs substrates has Cloc
kwise-hysteresis loops due to the charge injections. It is also shown
that the remanent polarization estimated from the polarization-electri
c field (P-E) characteristics is as large as 1.2 mu C/cm(2).