OPTICAL-ABSORPTION EVIDENCE OF QUANTUM CONFINEMENT IN SI CAF2 MULTILAYERS GROWN BY MOLECULAR-BEAM EPITAXY/

Citation
F. Bassani et al., OPTICAL-ABSORPTION EVIDENCE OF QUANTUM CONFINEMENT IN SI CAF2 MULTILAYERS GROWN BY MOLECULAR-BEAM EPITAXY/, Applied surface science, 117, 1997, pp. 670-676
Citations number
13
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
117
Year of publication
1997
Pages
670 - 676
Database
ISI
SICI code
0169-4332(1997)117:<670:OEOQCI>2.0.ZU;2-R
Abstract
We have investigated the physical properties of nanocrystalline Si/CaF 2 multilayers grown by molecular beam epitaxy, which exhibit efficient visible luminescence at room temperature. X-ray diffraction under gra zing incidence as well as transmission electron microscopy demonstrate the periodicity of the multilayers. Extended X-ray absorption fine st ructure measurements show that the dimensions of the Si grains within the Si layers do not exceed 1.5 nm. We report on the optical absorptio n coefficient deduced from transmission measurements performed on samp les deposited on CaF2 substrates. The resulting optical pseudogap pres ents a large blue shift for decreasing Si layer thickness. The latter results are consistent with quantum confinement of carriers in the low -dimensional Si structures.