We report on the fabrication and the electrical characterization of th
e superconductor (Pb alloy)-semiconductor (InAs) junctions. Submicron
scale superconducting weak link devices were fabricated on InAs/AlGaSb
. The contact resistance of sequentially evaporated In/Pb/In and An/Pb
/In electrodes were reduced to be 0.2 Ohm mm. The differential resista
nce of the weak link devices measured between 2.6 and 5.5 K revealed m
ultiple Andreev reflection indicating ballistic carrier transport in t
he superconductor-semiconductor junction. The modulation of conductanc
e across the superconducting electrodes has been demonstrated on the P
b alloy-InAs structure for the first time by applying gate bias voltag
es at 4.2 K.