Attenuation of matrix effects in inductively coupled plasma mass spectrometry with a supplemental electron source inside the skimmer

Citation
N. Praphairaksit et Rs. Houk, Attenuation of matrix effects in inductively coupled plasma mass spectrometry with a supplemental electron source inside the skimmer, ANALYT CHEM, 72(11), 2000, pp. 2351-2355
Citations number
47
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL CHEMISTRY
ISSN journal
00032700 → ACNP
Volume
72
Issue
11
Year of publication
2000
Pages
2351 - 2355
Database
ISI
SICI code
0003-2700(20000601)72:11<2351:AOMEII>2.0.ZU;2-7
Abstract
Electrons are added from a heated filament at the base of the skimmer to re duce the space charge repulsion in the ion beam. This technique improves th e analyte sensitivity moderately and also minimizes the matrix effects caus ed by other elements in the sample significantly, The suppression of signal for even the most troublesome combination of light analyte and heavy matri x elements can be attenuated from 90 to 99% to only 2-10% for 2 mM matrix s olutions with an ultrasonic nebulizer, The supplemental electron current ca n be adjusted to "titrate" out the matrix effects as desired.