High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators

Citation
E. Semouchkina et al., High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators, ELECTR LETT, 36(11), 2000, pp. 956-958
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
36
Issue
11
Year of publication
2000
Pages
956 - 958
Database
ISI
SICI code
0013-5194(20000525)36:11<956:HFPDBS>2.0.ZU;2-S
Abstract
The S-21 spectra of microstrip ring resonators have been measured experimen tally and also computed using the finite-difference time-domain (FDTD) meth od. The dielectric constant of the substrate was determined by fitting the simulation results to the experimental data. The results are more self-cons istent than those obtained using the Wheeler-Hammerstad method.