Intermetallic layer growth at the solder/ substrate interface during solder
ing and subsequent aging in service can affect bond strength and dimensiona
l stability. In this work, interfacial structure and bonding strength studi
es were performed on lead-free, Sn-Zn-Al solders as a function of compositi
on and aging time. With the x value of Sn-x(5Al-Zn) solder increasing from
5 wt.% to 40 wr.%, the adhesion strength of bonding decreased from 12.2 +/-
0.5 MPa to 3.3 +/- 0.9 MPa while the thickness of the gamma-Cu5Zn8 interme
tallic compound layer in intermetallic compound layer increased from less t
han 1 mu m to about 2 mu m. Simultaneously, the adhesion strength of Sn-x(5
Al-Zn) solders with x = 5 9, 20, 30, and 40 decreased as the aging time at
150 degrees C increased from 0 to 1,000 hours.